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Aakash Parmar

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2026

Optimizing MNIST Digit Recognition for Edge Devices: A Multi-dimensional Evaluation Approach

The authors introduce the Edge Suitability Score (ESS), a composite metric that combines normalized accuracy, model size, and inference speed into a single value, weighted at 0.40, 0.35, and 0.25 to reflect their relative importance for microcontroller deployment.

Rajneesh Yadav, Aakash Parmar · 0 citations