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Author

Ande Sathvik

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Conference Aug 2026

Multi-Agent AI System for Autonomous Semiconductor Test Optimization

Semiconductor manufacturing generates large volumes of test, process, and equipment data that must be analyzed efficiently to ensure high yield, reliability, and operational efficiency. This paper presents an Explainable Multi-Agent AI Framework for Semiconductor Test Analytics and Optimization. The proposed framework...

Mousumi Bhanja, K. A, Silpakesav Velagaleti et al. · 0 citations

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