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Bartu Bisgin

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Oct 2026

3D Current Reconstruction for Failure Analysis with Quantum Diamond Microscopy

Reconstructing electrical current flow within integrated circuits is a powerful capability for electrical failure analysis (EFA), as it reveals the actual conduction paths associated with defects. Quantum Diamond Microscopy (QDM) enables non-destructive, vector-resolved magnetic field imaging, providing the basis for...

Simon Wanninger, Jin-Cheng Zhang, Maximilian Hecker et al. · 0 citations

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