Author

C. J. Teoh

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Preprint Aug 2026

Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework

This study proposes a supervised learning framework that predicts MBIST area and test time directly from RTL-level design parameters without synthesis, which enables faster estimation of MBIST costs and supports more efficient design decisions in memory IP development.

C. J. Teoh, Ab Al-Hadi Ab Rahman, Johnny Kee Hui Wong et al. · 0 citations