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Author

C. Krishna

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Open access Sep 2026

Unified Namespace (UNS) Architecture for High-Throughput Factory Data Ingestion and Analytics

The Factory Integration Layer is introduced, a scalable, event-driven platform designed to bridge the gap between Information Technology (IT) and Operational Technology (OT) systems across globally distributed manufacturing sites, enabling seamless data integration and AI-driven innovation.

Farhan Siddiqui, C. Krishna, Nirav Goradia et al. · 0 citations
Open access Jul 2026

A Study to Assess Knowledge, Attitude, and Practice of Materiovigilance Among Healthcare Professionals in a Tertiary Care Hospital

Although knowledge and attitude toward materiovigilance were generally adequate, particularly among medical practitioners, reporting practices remain suboptimal and structured institutional training is necessary to improve compliance and strengthen device safety surveillance.

CH. Kalyan Krishna, N. G., R. Latha et al. · 0 citations

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