Author

Chuan Zhang

h-index 1 View on Semantic Scholar

We have 1 of 12 papers

We haven’t gathered this author’s papers yet. Follow them and we’ll fetch their work.

Not the right person? Other researchers publish under this name.

Review Oct 2026

AI-Driven Super-Resolution Enhancement of Scanning Electron Microscopy Images for Semiconductor Failure Analysis

Scanning electron microscopy (SEM) is central to semiconductor failure analysis (FA), but high-resolution acquisition is slow, and fast survey scans often lack the detail needed to decide where to look closely. We report two results on enhancing low-detail SEM images of static random-access memory (SRAM) arrays. Firs...

Alexey Solovey, J. Elliott, Chuan Zhang et al. · International Symposium for... · 0 citations