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Dongmin Kim

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Aug 2026

Extreme Bond Ionicity in Mg─Te Chalcogenides for Ultrathin Low Voltage Selector-Only Memory beyond the Leakage Scaling Limit.

Conventional ovonic threshold switching (OTS) chalcogenides face a fundamental scaling limit for selector-only memory (SOM), because aggressive thickness scaling increases leakage current and hinders reliable low voltage operation. Here, this trade-off can be overcome by exploiting the unique materials characteristics...

Yoori Seo, Dongmin Kim, Y. Park et al. · 0 citations

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