F. Megahed

Beyond CLIP: Calibrated (Few-Shot) Defect Detection With System One Decision Models

This paper examines the utility of two recently proposed structured decision models (Jev and Clef-Flash) in applications using as few as k=2 reference images per class at inference and shows that the agentic refinement of text descriptions significantly improves accuracy across 6 of 8 model-application combinations, an...