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G. Bottiglieri

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Oct 2026

Hyper-NA EUV lithography: challenges and opportunities for advanced interconnect patterning

BackgroundContinued device scaling beyond high numerical aperture (NA) EUV (NA=0.55) resolution motivates the exploration of “hyper-NA” EUV lithography systems (NA≥0.75), which promise improved contrast and resolution but introduce stronger mask 3D effects, increased polarization sensitivity, and reduced depth of focus...

G. Bottiglieri, Michael Patra, Bram Slachter et al. · 0 citations

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