Hitoshi Tampo

Adaptive mixture-of-experts denoising for deep learning of optical ellipsometry spectra

Spectral noise limits the reliability of deep-learning ellipsometry (DLE), particularly under short measurement times required for high-throughput materials characterization. Here, we propose an adaptive denoising framework that integrates a Mixture-of-Experts (MoE) module into a U-Net architecture for spectroscopic el...