Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)
Angle-resolved photoemission spectroscopy (ARPES) requires a well-ordered surface, whose quality is routinely judged from low-energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS). We compare LEED, XPS, and ARPES of a Cu(001) single crystal measured in situ at four stages of surface preparation:...