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Jin-Ju Lee

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Preprint Oct 2026

Angle-Resolved Photoemission as a Sensitive Probe of Surface Quality: Sputtered versus Annealed Cu(001)

Angle-resolved photoemission spectroscopy (ARPES) requires a well-ordered surface, whose quality is routinely judged from low-energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS). We compare LEED, XPS, and ARPES of a Cu(001) single crystal measured in situ at four stages of surface preparation:...

Hyeonhee Na, Jeonghwan Oh, Jin-Ju Lee et al. · 0 citations

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