Author

Jinan Gu

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Open access Oct 2026

DAF-YOLO for Detecting Small Defects with Weak Visual Features on Chip Surfaces

Vision-based inspection of chip surface defects is essential for automated quality control in electronics manufacturing. However, small defects are easily missed, weakly textured defects are difficult to distinguish, and imbalanced class distributions can bias the detector towards majority classes. To address these c...

Kai-Wei Wang, Ji-Nan Gu, Juan Huang · Engineering Research Express · 0 citations

Open access Aug 2026

Fast-YOLO11n: A Lightweight and Efficient Apple Detection Model for Complex Orchard Environments

The proposed model provides a favorable balance between detection accuracy and computational efficiency, indicating its potential for real-time orchard perception on resource-constrained platforms.

Jinan Gu, Zhong-Kai Shen, Juan Liu et al. · Agriculture · 0 citations