Jul 2026
Multiple environmental test and genetic mapping jointly reveal genomic loci and associated genes underlying cotton Verticillium wilt resistance
This study systematically evaluated VW resistance in a recombinant inbred line (RIL) population and a backcross population comprising 325 BC5F4 families, under both greenhouse and field disease-nursery conditions, and pinpointed three key candidate resistance genes harboring nonsynonymous mutations.
Ya-Lin Zhang, Li-Hong Zhao, Zi-Ming Li et al.
· Theoretical and Applied Gene... · 0 citations