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Author

Jun-Bo Liu

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Conference Sep 2026

Research on noise suppression in phase unwrapping for Ronchi shearing interferometry

Lithography lies at the heart of integrated circuit manufacturing, and its projection lens is a key part that directly determines the device’s resolution through imaging quality. This imaging quality is typically characterized by wavefront aberration, and high-precision measurement of wavefront aberrations is an essent...

Yong-Sheng Hui, Jian-Ke Li, Ji Zhou et al. · 0 citations

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