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Leehee Kim

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#large language models Open access Oct 2026

Identifying technological problems and exploring potential solutions to support R&D: Tech-mining with multi-LLM applications

The shortening of technology lifecycles and growing technological complexity have made the rapid identification of technical problems and exploration of solutions a critical challenge. Patent analysis can serve as a crucial tool for supporting R&D activities by extracting problem–solution pairs from patent documents. H...

Sanghyun Park, Leehee Kim, Doyoung Park et al. · 0 citations

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