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Open access 2026

EMA-YOLO: An Efficient, Lightweight Network for Surface Defect Detection on Metal Substrates

To address the challenges of false positives caused by background interference and missed detections of minute defects in current metal substrate surface inspection, as well as the efficiency requirements of edge-oriented industrial inspection systems, this paper proposes an efficient and lightweight deep learning netw...

Qi Ouyang, Yun Li, Lun Huang et al. · 0 citations

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