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M. E. Iglesias Martínez

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Open access Jul 2026

A Comparison of Supervised Machine Learning Algorithms for Defective Pixel Detection

The proposed framework provides reproducible reference results for evaluating supervised machine learning approaches to defective pixel detection while analyzing the influence of feature extraction window size on classification performance and reconstructed image quality.

Bárbaro M. López-Portilla, Kristian Balzer, Lorena Carballo et al. · 0 citations