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M. W. Amir

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Open access Sep 2026

On Developing Robust Monitoring Scheme for Location Parameter

Statistical Process Control (SPC) charts are extensively utilized in quality monitoring to maintain process stability and identify shifts within production systems. Conventional location control charts, like the Shewhart chart, are designed based on the premise that process data adheres to a normal distribution. Neve...

R. Arshad, Noureen Akhtar, H. Nazir et al. · 0 citations

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