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Martin Plettig

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#software testing Open access Sep 2026

Integration of Thermographic Data into 3D Component Models for Defect Localization and Data Migration into the Digital Twin

Lock-in thermography (LIT) is an established non-destructive testing method for detecting surface and near-subsurface defects based on amplitude and phase information. However, the resulting measurement data are typically available as two-dimensional image information, which limits the direct geometric assignment of de...

Jihed Ben Majed, S. Panahandeh, Dustin Nielow et al. · 0 citations

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