Ming-Chao Deng

DINO for PCB defect detection: adaptive feature pyramid and hard negative contrastive alignment

Detecting minute defects in printed circuit boards (PCBs) against highly repetitive background textures remains a fundamental challenge for end-to-end detectors. Subtle defect features are easily weakened during conventional crossscale fusion, while normal patterns such as traces, pads, and vias may produce strong fals...