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Author

Mohammad Aljaidi

2 papers indexed here

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Open access Aug 2026

Ensemble attention deep network for imbalanced silicon wafer defect inspection

Automated silicon wafer defect inspection is critical for sustaining yield and reliability in semiconductor manufacturing. Traditional image processing and feature engineering approaches struggle with complex and evolving defect patterns, while deep learning methods, although effective, increase computational cost and...

Uzma Batool, Zahid Iqbal, M. I. Shapiai et al. · 0 citations
Conference Jul 2026

A Novel Hybrid Meta-Heuristic Optimization Approach for Plug-in Electric Vehicles Charging Stations Placement in Smart Cities

Plug-in electric vehicles (PEVs) feature rapid proliferation as a result of their low carbon emissions, reduced maintenance requirements and cost efficient operation. Nonetheless, increased penetration from PEVs poses significant challenges to distribution networks in terms of higher power losses, voltage stability and...

Mohammad Aljaidi, Rami Almatarneh, Ghassan Samara · 0 citations

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