Preprint
Aug 2026
Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework
This study proposes a supervised learning framework that predicts MBIST area and test time directly from RTL-level design parameters without synthesis, which enables faster estimation of MBIST costs and supports more efficient design decisions in memory IP development.
C. J. Teoh, Ab Al-Hadi Ab Rahman, Johnny Kee Hui Wong et al.
· 0 citations