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Open access Aug 2026

Focal spot morphology reconstruction and dimensional quantification of microfocus x-ray sources using combined edges rotation method

Micro-computed tomography (micro-CT) is a fundamental technology for detecting micro-defects and characterizing three-dimensional internal structures. It is widely used in advanced semiconductor packaging, new material research, and micro-nano manufacturing. The size and two-dimensional morphology of x-ray focal spots...

Guo-Wei Zhong, Cheng-Feng Liu, Feng-Xiao Li et al. · 0 citations

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