Author

R. Armiento

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#machine learning Preprint Sep 2026

Prescreening Point Defects in Semiconductors With Machine Learning

High-throughput calculations using density-functional theory (DFT) are commonly used to explore point defects for applications in power electronics and quantum technologies. There is currently a major shift away from these traditional simulation techniques towards machine learning (ML) methods. We explore a class of ph...

P. Karlsson, J. Davidsson, R. Armiento · 0 citations