Skip to content
Log in

Author

Rajneesh Yadav

View on Semantic Scholar

1 paper indexed here

We haven’t gathered this author’s papers yet. Follow them and we’ll fetch their work.

Not the right person? Other researchers publish under this name.

2026

Optimizing MNIST Digit Recognition for Edge Devices: A Multi-dimensional Evaluation Approach

The authors introduce the Edge Suitability Score (ESS), a composite metric that combines normalized accuracy, model size, and inference speed into a single value, weighted at 0.40, 0.35, and 0.25 to reflect their relative importance for microcontroller deployment.

Rajneesh Yadav, Aakash Parmar · 0 citations