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Preprint Oct 2026

SeriesXRD: automated reflection tracking and phase identification in high-pressure X-ray diffraction series

High-pressure synchrotron X-ray diffraction increasingly produces hundreds to thousands of detector frames in a single experiment, while separating, assigning, and tracking weak reflections across an entire series often remain manual. This bottleneck is particularly severe for micron- and nanoscale samples in diamond-a...

Rush Maples, Z. Rehfuss, Hong-Ying Liu et al. · 0 citations

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