Open access
Oct 2026
Unsupervised machine learning for automated crystal orientation mapping on noisy 4D-STEM data
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a high-throughput measurement used to comprehensively acquire diffraction patterns across a region of interest in a specimen. While the measurement is useful for identifying crystallographic microstructures, the data analysis requires significant...
Kai Kamijo, Motoki Shiga, Shusuke Kanomi et al.
· npj Computational Materials · 0 citations