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Siyang Cai

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Preprint Jul 2026

RTLCurator: Label-Efficient Data Curation for RTL Generation

Training large language models (LLMs) to write register-transfer level (RTL) requires large corpora of paired specifications and code, and such data is scarce enough that most public corpora are now synthesized. Synthesis provides scale but not correctness, and in two widely used RTL datasets only 24.4% and 53.5% of pairs pass generated functional tests. This raises the question of how much of such a corpus to keep and which part of it. Correctness alone is a poor answer. A pair that misbehaves in one corner case still shows valid syntax and interface conventions, and complex sequential designs are both harder to generate and harder to validate, so filtering by correctness leaves a corpus of short and simple modules. Correctness is also hard to obtain, since behavior leaves little trace on the surface in RTL, and validating an entire corpus only sorts pairs into passed and failed. We present RTLCurator, which learns a behavior-aware compatibility prior by contrasting each specification with implementations that fail simulation, and calibrates it to a new corpus using a small number of validated pairs. It then constructs the retained subset by balancing alignment, representation coverage, and RTL structural richness. On CodeV and RTLCoder, keeping 80% of the corpus this way improves on training with the full corpus across all reported metrics while validating only 10% of the pool, whereas ranking by the score alone falls below random selection and filtering the whole pool by simulation does no better.

Siyang Cai, Cangyuan Li, Wenjing Chang et al. · 0 citations
Preprint Jul 2026

When Fuzzing Meets Understanding: LLM-Driven Semantic Test Generation for RTL Verification

The growing complexity of modern chips poses significant challenges to hardware verification. In recent years, coverage-guided fuzzing has emerged as a promising approach for improving verification efficiency. However, existing hardware fuzzers still struggle to achieve high coverage and expose corner-case bugs, as they predominantly rely on heuristic strategies with limited ability to reason about the internal logic and semantic behavior of the design under test (DUT). In this work, we propose ChipFuzzer, a hardware fuzzing framework that leverages the semantic reasoning capabilities of large language models (LLMs) to improve fuzzing effectiveness. ChipFuzzer adopts a dual-stage workflow comprising a Coverage-Guided stage and a Bug-Guided stage. In the Coverage-Guided stage, ChipFuzzer employs control-flow similarity and discrepancy analysis to guide LLM-driven testcase generation, thereby improving coverage. In the Bug-Guided stage, ChipFuzzer leverages historical bug data to identify bug-prone code regions and prioritize testcase generation for those regions, thus enhancing bug discovery efficiency. Experimental results on three open-source CPU designs show that ChipFuzzer improves average condition coverage by 5.8 percentage points and bug detection rate by 21.1 percentage points over the strongest baseline.

Kun Wang, Cangyuan Li, Kaiyan Chang et al. · 0 citations