A unified self-supervised framework for single-frame Fresnel CDI and overlapped ptychography
Ptychographic imaging at synchrotron and X-ray free-electron laser sources requires densely overlapping scans, which limits throughput and increases dose; extending coherent diffractive imaging to overlap-free operation on extended samples remains an open problem. We present a self-supervised inverse-mapping network fo...
O. Hoidn, Steven Henke, A. Vong et al.
· Optics Express · 1 citation