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Sponsored Artificial Intelligence: A Modern Approach, Global Edition Artificial Intelligence: A Modern Approach, Global Edition

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T. Duty

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Open access Aug 2026

Structural disorder and critical voltage scaling in Al/AlO <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:msub> <mml:mi/> <mml:mi>x</mml:mi> </mml:msub>

The insulating state of one-dimensional Josephson junction (JJ) arrays is governed by collective charge dynamics and disorder-induced pinning, resulting in a finite critical voltage under dc bias. Here, we investigate the influence of fabrication-induced structural defects on the critical-voltage scaling of small-capac...

Amanuel Berhane, S. Coppersmith, Emma E. Mitchell et al. · 0 citations

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