A Machine Learning Approach to Test Pattern Prediction for VLSI Circuits Using Random Forest Regressor
Sima K. Gonsai, Usha Mehta
· 0 citations
2 papers indexed here
We haven’t gathered this author’s papers yet. Follow them and we’ll fetch their work.
Not the right person? Other researchers publish under this name.
Open access
Oct 2026
Machine Learning Approach to ATPG in VLSI Circuits Using Random Forest Regressor
As the need for highly advanced chip technology and high-performance computing grows, semiconductor technology must develop rapidly. Also, as VLSI circuits become more complex, it is more difficult and time-consuming to test circuits using traditional test methods. Hence, Chip design, verification, and testing become e...
Sima K. Gonsai, Usha Mehta
· Journal of Electronics Elect... · 0 citations