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V. Govindaraj

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Open access Sep 2026

Computational modeling of catastrophic fault classification in Digital to Analog Converters using machine learning

A large part of the cost of producing Digital to Analog Converters (DACs) is related to testing, due to factors such as long time taken for analog fault diagnosis, increased testing time and expensive equipment being required for testing. Therefore, using Machine Learning (ML) based fault classification offers a promis...

V. Govindaraj, M. Sheela, M. Muthuraja et al. · 0 citations

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