Wei-Lin Tu

Few-Shot Anomaly Detection on MVTec AD 2: A Systematic Study and a Strong Frozen Baseline

Industrial inspection must detect and localise defects when new production lines provide only a few defect-free reference images. On MVTec AD 2, few-shot evidence remains fragmented across reference budgets, seeds, and metrics, obscuring which design choices matter. We close this gap with the first systematic multi-bas...