Wen Sun

A Progressive Transfer Learning Method for Real-Time Detection of Wafer Test-Induced Defects

Wafer-level testing is essential for detecting defects caused by fabrication process deviations. However, test failures may introduce misjudgment and even physical damage to defect free wafers, resulting in wafer test-induced defects (WTIDs) with significant impact on yield management. Although convolutional neural net...