Detecting third-party libraries (TPLs) in C/C++ binaries is essential for software supply chain security, enabling vulnerability identification and license compliance. Existing methods predominantly rely on similarity matching: extracting features from binaries and comparing them against library databases. However, sim...
Cheng-Yue Liu, Zheng-Zi Xu, Lyuye Zhang et al.· Proceedings of the ACM on So...· 0 citations
As software usage continues to expand, package managers automatically resolve dependencies to construct a dependency graph based on user-specified requirements. These explicitly declared dependencies, known as direct dependencies, receive significant attention in terms of maintainability and security. However, implicit...
Lyuye Zhang, Chengwei Liu, Fang-Yuan Zhang et al.· 0 citations
The results show that multi-SP vulnerabilities are both prevalent and systematically underreported, motivating stronger patch-completeness awareness, improved vulnerability database curation, and relation-aware security tooling.
Fang-Yuan Zhang, Lyuye Zhang, Lingling Fan et al.· 0 citations
The first large-scale measurement of skill name hallucination is conducted, evaluating 15,000 prompts across 12 configurations and revealing a systemic vulnerability: every configuration hallucinates.
Public reports and open-source resources expose many EDR evasion techniques, but it remains unclear whether commercial Endpoint Detection and Response (EDR) systems can withstand these documented attacks. Evaluating them requires turning fragmented security knowledge into working payloads and refining those payloads fr...
Wei Yuan, Wenbo Guo, Qing-Yun Du et al.· 0 citations
This work presents Porting Benchmark, a curated dataset of 1,234 security patch backporting cases spanning cross-version, cross-branch, and cross-repository scenarios, paired with a common evaluation framework and identifies four root-cause categories (missing target API awareness, cross-version semantic mismatch, non-...
Jin-Cheng Yang, Yu-Long Fu, Cheng-Wei Liu et al.· Proceedings of the 41st IEEE...· 1 citation
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