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Yi-Bing Liu

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Open access Aug 2026

A Comparative Study of Machine Learning Algorithms for Measuring Thin-Film Thickness Using Terahertz Time-Domain Waves Simulated by the Finite Difference Time Domain Method

Terahertz (THz) waves offer unique advantages, including non-contact operation, high penetration capability, and high resolution, making them particularly well-suited for the non-destructive thickness measurement of film-structured materials. In reflective terahertz time-domain spectroscopy (THz-TDS), thickness measure...

Pingan Liu, Xiangjun Li, Yi-Bing Liu et al. · 0 citations

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