Deep Learning to Automate Parameter Extraction and Model Fitting of Two-Dimensional Transistors
A deep learning approach to extract physical parameters of two-dimensional transistors from electrical measurements, enabling automated parameter extraction and technology computer-aided design (TCAD) fitting, and applies this approach to reverse-engineer key parameters from experimental monolayer WS2 transistors.
R. K. A. Bennett, Jan-Lucas Uslu, Harmon F. Gault et al.
· Research · 2 citations