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Zhi-Hui Li

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Open access Sep 2026

A Lightweight Classification Method Based on You Only Look Once Version 8 and Convolutional Block Attention for Scanning Electron Microscopy Images of Metal Fracture Surfaces

In the failure analysis of metallic materials, the observation of fracture-surface morphology by scanning electron microscopy (SEM) is an important means of determining the fracture mechanisms. In practice, however, interpretation of fracture-surface images relies heavily on expert experience and is readily affected by...

Zhi-Hui Li, Peng Wang, Qun-Jia Peng et al. · 0 citations

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