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Zhi-Yong Hu

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Conference Sep 2026

Surface defect detection YOLO based on prototype enhancement

With the rapid development of deep learning, industrial defect detection has achieved significant improvements in performance and accuracy. However, most existing methods depend on large-scale annotated datasets and substantial computational resources, which limits their applicability in industrial scenarios where defe...

Zhi-Qiang Lu, Wei-Yan Liu, Li-Peng Pan et al. · 0 citations

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