Conference

Prior-Shift-Aware Cross-Domain Wafer Defect Classification using EfficientNet and Unbalanced Optimal Transport

G. Kiran S. V. Bhumireddypalli Veerasekharreddy M. Mounika B. SaiLikhitha G. Vaishnavi

Aug 2026 · International Conference Electronic Systems, Signal Processing and Computing Technologies [ICESC-] · pp. 2085-2089 · 0 citations · 15 references

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