2026· Proceedings of the 3rd International Conference on Mechanics, Electronics Engineering and Automation, ICMEEA 2026, April 24-26, 2026, Singapore, Singapore· 0 citations· 17 references
TL;DR
It is found from the principle that the two modeling ideas are not in a replacement relationship but complement each other, and the traditional formula-driven method has high interpretability and is an effective method for precise simulation and design of core devices at the current stage.
Abstract
. As the process nodes of integrated circuits approach the nanoscale, precise delay modeling has become a key factor in determining the performance and reliability of chips. Traditional model-based methods, which rely on mechanism-based reasoning for modeling, have limitations. In contrast, the new modeling paradigm based on machine learning has significant advantages. However, the two approaches, starting from different paths, have different fundamental idea s . This paper takes the technological development process of digital circuit delay modeling as an example, reviews the development history and comparison of the classic logic effort theory and various popular machine learning techniques at present, and constructs a framework to analyze the differences between these two types of modeling methods from aspects such as modeling philosophy, accuracy and efficiency, interpretability, data dependence, and generalization ability. It is found from the principle that the two modeling ideas are not in a replacement relationship but complement each other. The traditional formula-driven method has high interpretability and is an effective method for precise simulation and design of core devices at the current stage; while the data-driven modeling method based on big data can obtain more accurate results by learning from large-scale data. From a practical perspective, the trend of big data and high computing power is unstoppable. Therefore, as the two continue to integrate, it will further promote the development pace. Eventually, it will drive EDA towards a more intelligent "AI-native" direction.
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Proactive power management systems reduce processor dynamic power through runtime power prediction and power-aware scheduling. Accurate, stable and low-overhead digital on-chip power meters (OPMs) are crucial for improving the prediction quality. Recent studies have explored various modeling methods, including using li...
Jing-Bo Jiang, Xi-Zi Chen, Jian Peng et al.· 0 citations
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P. Lugli, D. Marian, A. Toral-López et al.· ACS Applied Electronic Mater...· 0 citations
The identification of faults in analog filter electronic systems has been challenging due to their non-linear characteristics, sensitivity to parameter variations and complex component interactions. Traditional fault diagnosis methods often involve lengthy testing procedures and fail to provide reliable results for mod...
V. Govindaraj, C. Ezhilazhagan, K. L. Prabha et al.· Discover Artificial Intellig...· 0 citations
In the post-Moore era, traditional integrated circuit (IC) design faces bottlenecks such as long design cycles, high costs, and difficulty in PPA convergence. Artificial intelligence (AI), with its data-driven and global optimization capabilities, has pene trated the entire IC design process. This paper systematically...