Introducing dependency, exception and encapsulation metrics for object-oriented defect prediction: Complementarity with CK/MOOD metrics through empirical machine learning and statistical validation
F. Mekahlia
Mohamed Ilyes Bouguerri
Zineddine Djama
Rabah Chabane-Chaouche
Dhouha Yousra Dris
Lynda Abdoun
Ahmed Taha Haouari
Computer Science