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Byeongjun Joo

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Open access Oct 2026

Reliable HCI-Based Programming in V-NAND Flash Memory: Co-optimization of SWL Waveform and Trap-Cut Architecture

Hot carrier injection (HCI)-based programming has emerged as a high-efficiency alternative to conventional Fowler–Nordheim (FN) tunneling for next-generation vertical NAND (V-NAND), yet its practical implementation is severely constrained by coupled physical reliability trade-offs: program disturb, Z-interference, an...

Byeongjun Joo, Choasub Kim, Donggi Lee et al. · 0 citations

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