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Author

C.-N. Hsiao

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Preprint Sep 2026

Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning

Atomic-scale phase imaging is central to resolving defects, interfaces, and weakly scattering atoms that govern the behavior of nanoscale materials. Electron ptychography delivers sub-{\aa}ngstr\"om phase sensitivity but remains an offline technique, because its iterative reconstruction is computationally expensive and...

H. Yue, Charles B. Chen, C.-N. Hsiao et al. · 0 citations

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