Skip to content
Log in
Sponsored AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI

Author

Fan Jiang

View on Semantic Scholar

1 paper indexed here

We haven’t gathered this author’s papers yet. Follow them and we’ll fetch their work.

Not the right person? Other researchers publish under this name.

Open access Oct 2026

A Modified YOLOv11 Model for Wafer Defect Detection Using Attentive Feature Interaction and Shape-Aware Loss

The results demonstrate the effectiveness of the proposed framework for high-throughput wafer-defect inspection on desktop-class hardware, and its low parameter count makes it a promising candidate for future deployment on resource-constrained edge devices.

Fan Jiang, Hua-Ching Chen, Song-Lin Wei et al. · 0 citations

We use cookies to run the site and, with your consent, for analytics and to show ads. See our Cookie Policy.