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Thai Van Nguyen

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Conference Jul 2026

An IoT-Based Embedded System for Automated Digital IC Testing Using CAN Bus Communication

This paper presents an IoT-based embedded system for automated digital IC testing, addressing the high cost and limited flexibility of conventional Automated Test Equipment (ATE). The proposed system adopts a distributed architecture consisting of one master controller and up to three testing nodes interconnected via a...

Thai Van Nguyen, Harvey Tran, B. Q. Bùi et al. · 0 citations

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