An IoT-Based Embedded System for Automated Digital IC Testing Using CAN Bus Communication

Abstract

This paper presents an IoT-based embedded system for automated digital IC testing, addressing the high cost and limited flexibility of conventional Automated Test Equipment (ATE). The proposed system adopts a distributed architecture consisting of one master controller and up to three testing nodes interconnected via a CAN bus network. Each node performs functional verification using truth-table comparison and electrical fault detection including short-circuit identification via ADC-based voltage monitoring. The system integrates real-time data acquisition, an HMI touchscreen for local operation, and a desktop application for remote monitoring via MQTT over WiFi. Experimental results on multiple 74HC series ICs demonstrate: (i) 100% short-circuit detection accuracy, (ii) 93.3% functional fault detection accuracy, (iii) CAN bus communication latency under 10 ms, and (iv) successful parallel testing across three nodes simultaneously. With a total hardware cost under $300, the proposed solution provides a scalable, cost-effective alternative for IC testing in educational laboratories and small-scale production environments.