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U. Griesmann

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Oct 2026

Binary pseudo-random array (BPRA) for inspection and calibration for cylindrical wavefront interferometry

High‑accuracy metrology is essential for fabricating and optimizing free‑form X‑ray mirrors, where nanometer‑scale precision demands reliable calibration of instrument performance. Binary pseudo‑random array (BPRA) “white‑noise” artifacts enable direct determination of an instrument’s transfer function (ITF). To extend...

K. Munechika, U. Griesmann, C. Pina-Hernandez et al. · 0 citations

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