Preprint
Sep 2026
Universal Drift Correction for Multidimensional Scanning Microscopy
In scanning microscopy, drift causes the specimen to be sampled at positions displaced from the nominal probe positions. This displacement alters the spatial assignment of the recorded signals and biases quantitative measurements across two-dimensional imaging, channel-resolved spectroscopic mapping, and scan-position-...
Sangjoon Lee, William Millsaps, Da-Woon Yoon et al.
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